Citation:
Li B-H, Sanders CE, McIlhargey J, Cheng F, Gu C, Zhang G, Wu K, Kim J, Mousavi H, Khanikaev AB, et al. Contrast between SPP-mediated EOT behavior in epitaxial and polycrystalline Ag films in the mid- and far-infrared regimes. Nano Letters [Internet]. 12 (6187 ).